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BGA插座系列
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Technical Specifications |
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Compact Size
Compact design
maximizes PCB real estate - only 0.139/(3.52mm)nominal wider
than BGA device body size on clamp side.
Specifications
Terminals
Brass; Copper Alloy (C36000), ASTM-B-16
Plating
(Terminals and Contacts)
Gold over Nickel
Body Material
Molded PPS (high temp. glass filled thermoplastic), U.L. Rated
94V-0, -60°C to 260°C (-76°F to 500°F)
Contacts
Beryllium Copper; Copper Alloy (C17200), ASTM-B-194
Solder Ball
63Sn/37Pb, Eutectic, 183°C (361.4°F)
Socket
Adapter Systems
Test Results for
1.27mm Pitch, Low Force Contacts (P/N 1427-1G) - Test Report No.
92351A
Durability
50 Cycles at 1 inch per minute, followed by Low Level Resistance
Test.
3.1 m Ohm Average, +0.1 m Ohm average change
Vibration
MIL-STD 1344, Method 2005 Test, Condition III, 15 G's followed
by Low Level Resistance Test.
2.8 m Ohm Average, -0.0 m Ohm average change
Gas Tight
Exposed in a sealed container to concentrated Nitric Acid (NHO3)
followed by Low Level Resistance Test.
3.4 m Ohm Average, +0.5 m Ohm average change
Moisture
Resistance
Temperature cycling with humidity MIL-STD 1344, Method 1002,
Type II, followed by Low Level Resistance Test.
3.4 m Ohm Average, +0.7 m Ohm average change
Shock
MIL-STD 1344, Method 2004, Test Condition A.
No mechanical damage or loss of continuity
Thermal Cycle
MIL-STD 1344, Method 1003, Test Condition A.
3.4 m Ohm Average, +0.7 m Ohm average change
Temperature Life
MIL-STD 1344, Method 1005, Test Condition 2.
3.8 m Ohm Average, +0.8 m Ohm average change
Porosity
MIL-STD 1344, Method 1017
No porosity
Contact
Resistance
MIL-STD 1344, Method 3002, measured using 100m amp test current.
3.0 m Ohm average
Contact Force
Initial insertion force: 28.5g average (1.0 oz. average)
Initial withdrawal force: 18.5g average (0.7 oz. average)
Self Inductance*
2.52 nH Average at 1 GHz
Loop Inductance*
2.26 nH Average at 1 GHz
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